RANDOM VS. SCENARIO-BASED VS. FAULT-BASED TESTING - An Industrial Evaluation of Formal Black-Box Testing Methods

Martin Weiglhofer, Franz Wotawa

2008

Abstract

Given a formal model of a system under test there are different strategies for deriving test cases from such a model systematically. These strategies are based on different underlying testing objectives and concepts. Obviously, their usage has impact on the generated test cases. In this paper we evaluate random, scenario-based and fault-based test case generation strategies in the context of an industrial application and assess the advantages and disadvantages of these three strategies. The derived test cases are evaluated in terms of coverage and in terms of the detected errors on a commercial and on an open source implementation of the Voice-Over-IP Session Initiation Protocol.

Paper Citation

in Harvard Style

Weiglhofer M. and Wotawa F. (2008). RANDOM VS. SCENARIO-BASED VS. FAULT-BASED TESTING - An Industrial Evaluation of Formal Black-Box Testing Methods . In Proceedings of the Third International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE, ISBN 978-989-8111-28-9, pages 115-122. DOI: 10.5220/0001764501150122

in Bibtex Style

@conference{enase08,
author={Martin Weiglhofer and Franz Wotawa},
title={RANDOM VS. SCENARIO-BASED VS. FAULT-BASED TESTING - An Industrial Evaluation of Formal Black-Box Testing Methods},
booktitle={Proceedings of the Third International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE,},
year={2008},
pages={115-122},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0001764501150122},
isbn={978-989-8111-28-9},
}

in EndNote Style

TY - CONF
JO - Proceedings of the Third International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE,
TI - RANDOM VS. SCENARIO-BASED VS. FAULT-BASED TESTING - An Industrial Evaluation of Formal Black-Box Testing Methods
SN - 978-989-8111-28-9
AU - Weiglhofer M.
AU - Wotawa F.
PY - 2008
SP - 115
EP - 122
DO - 10.5220/0001764501150122