MEASUREMENT NOISE IN PHOTOMETRIC STEREO BASED SURFACE RECONSTRUCTION

Toni Kuparinen, Ville Kyrki, Pekka Toivanen

2008

Abstract

In this paper, we present a noise reduction method for photometric stereo based surface reconstruction of surfaces with high frequency height variation. Such surfaces are important for many industrial settings, for example, in paper and textile manufacturing. The paper presents the derivation of the effect of white image noise to gradient fields. Based on the derivation, a denoising approach of the gradient fields using the Wiener filter is proposed. Several known surface reconstruction methods with and without the proposed denoising approach are evaluated experimentally, with respect to the effect of the noise, and the boundary conditions of the reconstruction. The experimental results validate that the proposed approach improves the surface reconstruction on surfaces with high frequency height variation.

Download


Paper Citation


in Harvard Style

Kuparinen T., Kyrki V. and Toivanen P. (2008). MEASUREMENT NOISE IN PHOTOMETRIC STEREO BASED SURFACE RECONSTRUCTION . In Proceedings of the Third International Conference on Computer Vision Theory and Applications - Volume 1: VISAPP, (VISIGRAPP 2008) ISBN 978-989-8111-21-0, pages 571-576. DOI: 10.5220/0001083805710576

in Bibtex Style

@conference{visapp08,
author={Toni Kuparinen and Ville Kyrki and Pekka Toivanen},
title={MEASUREMENT NOISE IN PHOTOMETRIC STEREO BASED SURFACE RECONSTRUCTION},
booktitle={Proceedings of the Third International Conference on Computer Vision Theory and Applications - Volume 1: VISAPP, (VISIGRAPP 2008)},
year={2008},
pages={571-576},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0001083805710576},
isbn={978-989-8111-21-0},
}


in EndNote Style

TY - CONF
JO - Proceedings of the Third International Conference on Computer Vision Theory and Applications - Volume 1: VISAPP, (VISIGRAPP 2008)
TI - MEASUREMENT NOISE IN PHOTOMETRIC STEREO BASED SURFACE RECONSTRUCTION
SN - 978-989-8111-21-0
AU - Kuparinen T.
AU - Kyrki V.
AU - Toivanen P.
PY - 2008
SP - 571
EP - 576
DO - 10.5220/0001083805710576